Field Sharpness Uniformity Chart

Reveal Local Variations Invisible to Standard Methods

In many optical systems, alignment processes ensure that MTF values meet specifications in critical areas. However, this does not guarantee uniform performance throughout the field. Localized blur can still appear in intermediate zones, often going undetected with conventional testing approaches.
The FSU chart makes these defects immediately visible.

Its high-frequency structures react strongly to even slight optical degradation, allowing engineers to quickly identify:

• Localized blur zones outside the center and corners,
• Field non-uniformity caused by lens or sensor misalignment,
• Subtle defects linked to material or assembly variations.

This level of sensitivity is essential for modern imaging systems, where performance consistency is a key differentiator.

High Spatial Resolution Meets Visual Clarity

One of the defining strengths of the Field Sharpness Uniformity chart is its ability to combine measurement precision with intuitive interpretation.

The dense distribution of circular patterns creates a texture that naturally highlights sharpness variations. Even without complex analysis, differences in image quality become visible at a glance. This significantly accelerates validation workflows while maintaining a high level of diagnostic accuracy.

At the same time, the chart provides:

• Fine-grained spatial sampling across the full field
• High-frequency content for enhanced blur detection
• A reliable basis for both visual inspection and quantitative analysis